This panel will discuss the evolving role of licensing and damages expert witnesses in patent litigation across the US, Europe, the UK, and China. While the work of these experts often overlaps, their perspectives and methods can differ significantly. The panel will examine how licensing evidence—grounded in industry practice and negotiation norms—feeds into damages assessments, and how economic principles—comparability of licences and value-to-user—shape real-world negotiations and judicial outcomes. The panel will also explore how confidentiality constraints and varying national rules shape the admissibility and scope of expert testimony.
Drawing in cases from multiple jurisdictions, the panel will map the areas of overlap and distinction between licensing and damages expertise, providing a practical perspective on how expert evidence influences outcomes in patent litigation worldwide.
Speakers:
- Suvi Julin - Partner, Berggren OY (Moderator)
- David Drews - President, IPmetrics
- Jonas Heitto - Senior Licensing Manager, Nokia
- Shreya Gupta - Partner, Oxera Consulting
- Su Sun - Managing Director, Secretariat